26

Large-area X-ray and CL study of SI GaAs wafers from various suppliers

Year:
1992
Language:
english
File:
PDF, 1.19 MB
english, 1992
27

Point-like and extended defects in Si and GaAs

Year:
1993
Language:
english
File:
PDF, 1.62 MB
english, 1993
39

Analysis of SR thermal load studied by FEA

Year:
2007
Language:
english
File:
PDF, 467 KB
english, 2007
41

Study of residual strains in wafer crystals by means of lattice tilt mapping

Year:
1997
Language:
english
File:
PDF, 1.02 MB
english, 1997
47

Solid-state physics: Lost magnetic moments

Year:
2009
Language:
english
File:
PDF, 1.55 MB
english, 2009
48

X-ray flat diffractor optics I

Year:
2000
Language:
english
File:
PDF, 488 KB
english, 2000